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This MRI scan shows how cancer would grow in the future

PET MRI, a new cancer screening test can detect the disease in the body with greater accuracy. It can also chart out the possible course of malignancy in the future Suspecting that all was not......

IAF Fighter jet deal: It's Rafale vs Typhoon

India has shortlisted European defence firms Dassault and Eurofighter for the $11 billion fighter jet contract.Eurofighter is built by a consortium of four countries -- UK, Italy, Spain and......

System-on-chip: IIT achieves breakthrough

IIT Bombay and Infineon Technologies on Wednesday said they had jointly achieved a major breakthrough in integration of high voltage functionality for advanced CMOS technologies.Modern CMOS......

Stocks: What to buy, sell, hold now

After opening the week on a buoyant note, when it closed above 500 points, the Sensexonce more endeddown over 500 points on global cues. But is the worst over? Or is the Sensex likely to sink......

Jiah: I'm not another Urmila

Jiah Khan is pretty clear she's notanother Urmila Matondkar, but claims she has 'her own aura' in her debut film, Nishabd. The young actresswas candid about acting with Amitabh Bachchan, and firmly......
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Vishay Intertechnology's SQJ402EP ...

Vishay Intertechnology, Inc. (NYSE: VSH) today announced that the company's SQJ402EP 100 V n-channel power MOSFET and DG250x series of precision... ...

http://www.efytimes.com/e1/fullnews.asp?edid=161380
SerDes PHY for PCIe 2.0/3.0 achieves PCI-SIG compliance

Inc. has revealed that its multi-protocol serialiser/deserialiser (SerDes) PHY IP for PCI Express (PCIe) 2.0 and PCIe 3.0 technology for TSMC's... ...

http://www.eetindia.co.in/ART_8800710217_1800000_NP_3a63f6a6.HTM
Samsung Unveils World's First 10nm FinFET Chip Technology

Samsung recently announced that it started mass production of mobile application processors on its 14nm FinFET process technology, which is likely... ...

http://m.gadgets.ndtv.com/others/news/samsung-unveils-worlds-first-10nm-finfet-chip-technology-664421
Park Systems Joins Forces with imec to Develop Advancements in Nanoscale AFM Metrology Solutions for Semiconductor Manufacturing

PRWeb 2015-02-24 Park Systems, world-leader in Atomic Force Microscopes (AFM) announced today they have signed a Joint Development Project (JDP)... ...

http://www.bizwireexpress.com/showstoryPRWeb.php?storyid=369425
Applied Materials Unveils Breakthrough E-Beam Metrology Tool for FinFET Transistors and 3D NAND Devices

Comments February 23, 2015 - London New VeritySEM® 5i is the industry's first in-line 3D CD SEM metrology system for volume production of... ...

http://www.andhranews.net/Business/2015/Applied-Materials-Unveils-Breakthrough-E-Beam-Metrology-6824.htm

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Coming to India and making

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